Ambios Profilometer

Profilometry is a surface measurement technique to measure film step height or to quantify large-scale surface roughness. The profilometer at the Solar Power Laboratory is a “contact profilometer” in which a diamond stylus is moved vertically in contact with the sample and then moved laterally across the sample for a specified distance and specified contact force. The profilometer can measure small surface variations through vertical stylus displacement as a function of position.